thin film microscopy

Ultrahigh density data storage in p-Nitrobenzonitrile organic thin film by scanning tunneling microscopy

p-nitrobenzonitrile纳米有机薄膜的超高密度信息存储研究

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For a perpendicular anisotropic thin film, magnetic force microscopy directly gives its domain structure diagram. The component perpendicular to the film plane gives the position of the domain and the domain wall.

对于垂直各向异性的薄膜，磁力显微镜图直接给出了它的磁畴结构图，杂散场垂直于膜面的分量给出了它的磁畴和畴壁位置。

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The phase composition, microstructure and the element of the thin film were characterized respectively with X-ray, scanning electron microscopy and EDAX.

通过x射线衍射仪、扫描电镜、能谱分析仪分别对（Ti，Al）N薄膜的相结构、微观形貌及薄膜成分进行了检测与表征。

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The surface appearance and the effect of sputtering power on the roughness of thin film surface were investigated by atom force microscopy ( AFM).

应用原子力显微镜研究了薄膜的表面形貌，分析了溅射功率对薄膜表面粗糙度的影响。

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